VS-OSP charts topography and combine with other techniques for constant distance mode imaging.
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When combined with other techniques, OSP data provides a mechanism for Constant-Distance measurements removing a key complication of data interpretation
VS-SKP Scanning Kelvin Probe Microscope
VS-SDC Scanning Droplet Cell
VS-STYLUS Constant Distance SECM
VS-LEIS Localized Electrochemical Impedance Spectroscopy
