VS-LEIS measures local impedance, phase angle, and currents by measuring AC response.
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Sweep frequency at fixed position or Map area at fixed frequency LEIS provides spatial resolution to all the applications that benefit from EIS measurements Wide measurement bandwidth and high measurement accuracy combine to benefit local State-of-Charge (SoC) measurements and Coatings failure analysis
VS-OSP Non-contact Optical Surface Profiler
VS-STYLUS Constant Distance SECM
VS-SDC Scanning Droplet Cell
VS-SKP Scanning Kelvin Probe Microscope
