VS-SKP Scanning Kelvin Probe Microscope

VS-SKP Scanning Kelvin Probe Microscope

Features

VS-SKP measures relative Work Function Difference in air by a nondestructive capacitance method.

  • Uses a relative work function measurement, typically in atmospheric conditions, to map the anodic and cathodic nature of samples
enquire Now

Overview

Superior probe design and signal measurement capability provide high resolution measurements

Technical Information

Download

Related Products

VS-STYLUS Constant Distance SECM

VS-STYLUS Constant Distance SECM

VS-LEIS Localized Electrochemical Impedance Spectroscopy

VS-LEIS Localized Electrochemical Impedance Spectroscopy

VS-SDC Scanning Droplet Cell

VS-SDC Scanning Droplet Cell

VS-SVET Scanning Vibrating Electrode Technique

VS-SVET Scanning Vibrating Electrode Technique