SPECTRO XEPOS – XRF Spectrometer

XEPOS (SPECTRO XEPOS spectrometer)

Features

An elemental analyzer designed for demanding applications – the SPECTRO XEPOS energy dispersive X-ray fluorescence (ED-XRF) spectrometer redefines XRF analysis with exceptional new levels of performance

Measure lower than ever: Adaptive excitation, advanced tube design and high-count throughput detection system result in significantly (typically a factor 3) lower limits of detection for a wide range of elements
Outstanding sensitivity leads to up to a factor 3 improved precision – the basis for high accuracy when analyzing minor to major element concentrations
Outstanding sensitivity leads to up to a factor 3 improved precision – the basis for high accuracy when analyzing minor to major element concentrations

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The new SPECTRO XEPOS spectrometer represents a quantum leap in energy dispersive X-ray fluorescence technology. It provides breakthrough advances in multi-elemental analysis of major, minor, and trace element concentrations. New developments in excitation and detection deliver outstanding sensitivity and detection limits — yielding remarkable gains in precision and accuracy. The amazing SPECTRO XEPOS excels at critical tasks from rapid screening analysis to precise product quality control. Apply it for at-line processing in a variety of industries, for geology and mining, for environmental and waste monitoring, and for research and academia. Different versions maximize performance for selected elemental groups in specific matrices. An innovative X-ray tube and unique new adaptive excitation technology furnish the highest possible sensitivity, optimized to target elements of choice.