VS-SKP Scanning Kelvin Probe Microscope

VS-SKP Scanning Kelvin Probe Microscope

Features

VS-SKP measures relative Work Function Difference in air by a nondestructive capacitance method.

  • Uses a relative work function measurement, typically in atmospheric conditions, to map the anodic and cathodic nature of samples
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Overview

Superior probe design and signal measurement capability provide high resolution measurements

Technical Information

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