MSCL-XRF: X-RAY FLUORESCENCE (XRF) SPECTROSCOPY AND MULTI-SENSOR CORE LOGGING

MSCL-XRF: X-RAY FLUORESCENCE (XRF) SPECTROSCOPY AND MULTI-SENSOR CORE LOGGING

Features

Geotek offers a range of specialised core scanning/logging equipment that use XRF spectrometers to acquire elemental abundance from the surface of sediment and rock cores. The ability to continuously scan core samples using both petrophysical and spectroscopic techniques is a product unique to Geotek. XRF spectrometers can now be integrated into new or existing MSCL systems.

  • High performance large area silicon drift detector (SDD) with a helium-flushed measurement cell dramatically improves sensitivity, especially for the light elements such as Mg, Al, and Si
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Overview

Widest range of elements from Mg to U at ppm levels Motorised X-ray slits enable a downcore spatial resolution of 100 µm or less Sophisticated filter slide to lower detection limits across a wide range of elements, and allows different cross-core areas to be illuminated – perfect for high-resolution studies of dipping laminae Low power sealed X-ray source for long life (>10,000 hours) with no maintenance A unique close-coupled geometry for high efficiency at lower X-ray tube power Simple to use custom-designed software automatically communicates with the logger to acquire, interpret, and display the fluorescence spectra with element abundance during acquisition Precise measurements are assured through a combination of peak fit and deconvolution algorithms with a proprietary quantitative analysis suite

Technical Information

"GEOTEK XRF SENSOR SPECIFICATIONS X-RAY SOURCE 15W/50kV, Rh anode allowing sulphur detection, air-cooled X-RAY DETECTOR RaySpec SiriusSD Silicon Drift Detector, 30mm x 0.45μm, FWHM: down to 129eV at Mn Kα, (8μm) Bewindow SPECTRAL ANALYSIS bAxil"

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